Electrostatic Chuck (ESC 300mm AlN)

£15,000.00

The ESC 300mm AlN delivers uniform wafer clamping and precision thermal control for critical semiconductor etch and CVD processes, utilizing high-purity aluminum nitride to eliminate particle generation and ensure extreme RF stability. Engineered for 300mm foundry and memory fabs, this chuck maintains <±1.5% temperature uniformity across the entire wafer surface, directly improving yield-critical process windows.

Competitive Advantage Spotlight
Unlike polymer-based or alumina alternatives, our AlN ESC achieves >95% higher thermal conductivity with near-zero thermal drift, enabling aggressive 5nm-class process nodes while reducing mean time between cleans (MTBC) by up to 40%. The proprietary buried-electrode design and surface treatment provide unmatched Johnsen-Rahbek force consistency, even at low voltages (<800V), minimizing wafer bow and die-level arcing risks.

Description

1. Product Overview

The Electrostatic Chuck (ESC) 300mm AlN is a high-precision semiconductor substrate-handling component engineered for 300mm wafer processing in advanced etch, CVD, PVD, and ion implantation systems. Its primary industrial use is to secure silicon wafers uniformly during vacuum-based fabrication processes without mechanical clamping, eliminating particle generation and back-side damage. The key value proposition lies in its superior thermal conductivity (AlN base), high clamping force uniformity, and contamination-free operation, which directly translates to improved yield and lower cost of ownership. As wafer nodes shrink below 5nm and 3nm, the ESC’s role becomes strategically critical—enabling tighter process control and reducing defect densities in fabs where sub-0.1% particle adders are mandatory.


2. Key Specifications & Technical Characteristics

  • Material System: Aluminum Nitride (AlN) ceramic body + embedded molybdenum (Mo) or tungsten (W) electrode layer; dielectric coating (Al₂O₃ or Y₂O₃ optional for plasma resistance)

  • Purity: AlN ≥ 99.5% (trace oxygen < 1.0 wt%); electrode purity 99.95%

  • Physical Characteristics:

    • Diameter: 300 mm ±0.1 mm (SEMI-compliant)

    • Thickness: 10–15 mm (varies by pin lift design)

    • Surface roughness (wafer-contact side): Ra ≤ 0.4 µm (optimized for Coulomb/Johnsen-Rahbek operation)

    • Flatness: ≤ 20 µm over full diameter

  • Electrical Properties:

    • Dielectric strength: > 15 kV/mm

    • Volume resistivity (at 25°C): 10¹³–10¹⁵ Ω·cm (adjustable per ESC type)

  • Packaging Options: Class 10 cleanroom double-bagging + ESD-shielded vacuum-sealed container; individual certified shipping tray

  • Shelf Life: 24 months from date of manufacture in unopened, original packaging (stored at 20–25°C, < 40% RH)


3. Core Industrial Applications

  • Primary Industries: Semiconductor front-end manufacturing (foundries, IDMs, memory producers), advanced packaging, MEMS, and power device fabs.

  • Specific Operational Use Cases:

    • Dielectric Etch (e.g., SiO₂, SiN): Coulomb-type ESC ensures stable clamping under high RF power (≤ 5 kW) with helium backside cooling (10–30 Torr).

    • Metal Etch & PVD: Johnsen-Rahbek ESC provides faster de-chucking (< 2 sec) and lower residual voltage (< ±50 V), reducing wafer sticking.

    • CVD (PECVD, HDP-CVD): High thermal conductivity (≥ 170 W/m·K) minimizes wafer temperature non-uniformity (±1.5°C across 300mm).

  • Performance vs. Alternatives: Compared to ceramic Al₂O₃ ESCs, AlN delivers 3–5× higher thermal conductivity, enabling faster wafer heat dissipation and higher process power. Versus polymer or mechanical clamps, AlN ESC reduces particle adders by > 90% and eliminates edge exclusion zone losses, increasing usable die per wafer by ~2–3%.


4. Competitive Advantages

  • Quality Consistency: 100% electrical testing (capacitance, leakage current at 25°C–200°C), helium leak rate < 1×10⁻⁹ mbar·L/s, and lot-to-lot CpK ≥ 1.33 on clamping force uniformity.

  • Supply Reliability: Dual-source raw material agreements (Japan, Germany); 8-week standard lead time; buffer stock of 300+ units maintained in regional hubs (Taiwan, Korea, US, EU).

  • Logistics Capability: Direct delivery to fab sub-fab or forward stocking locations; temperature-controlled air freight available for emergency replacements (72-hour rush service).

  • Price Competitiveness: 15–20% lower total landed cost vs. incumbent Japanese suppliers, driven by automated near-net-shape AlN pressing and in-house electrode printing.

  • Sustainability & Support: Fully RoHS/REACH compliant; recycling program for end-of-life ESCs (40% material recovery). Technical documentation includes full FEA thermal-stress simulation report, installation qualification checklist, and 24/7 process integration engineering support.


5. Commercial & Supply Information

  • Minimum Order Quantity (MOQ): BULK 20MT
    (Note: Equivalent to approximately 1,300–1,500 units of 300mm AlN ESCs, depending on electrode design and thickness)

  • Loading Capacity:

    • 20 ft standard container: 18–22 MT (max 1,400 units)

    • 40 ft HC container: 26–28 MT (max 1,900 units)

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